Finite Element Approximation of a Phase Field Model for Void Electromigration
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Publication:4653884
DOI10.1137/S0036142902413421zbMath1076.78012WikidataQ117202807 ScholiaQ117202807MaRDI QIDQ4653884
John W. Barrett, Vanessa Styles, Robert Nürnberg
Publication date: 1 March 2005
Published in: SIAM Journal on Numerical Analysis (Search for Journal in Brave)
convergence analysis; finite elements; phase field model; void electromigration; fourth order degenerate parabolic system
78M10: Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory
65M60: Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs
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