Robust control and data‐driven tuning of a hybrid integrator‐gain system with applications to wafer scanners

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Publication:5222723

DOI10.1002/acs.2888zbMath1417.93121OpenAlexW2801698210WikidataQ129894062 ScholiaQ129894062MaRDI QIDQ5222723

Daniel Andreas Deenen, M. F. Heertjes, N. Irigoyen Perdiguero

Publication date: 10 July 2019

Published in: International Journal of Adaptive Control and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/acs.2888




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