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    DOI
    10.2307/1269883
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    author
    William Q. Meeker
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    publication date
    1987
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    zbMATH DE Number
    3984413
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    zbMATH Keywords
    integrated circuit reliability
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    Weibull distribution
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    lognormal
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    maximum likelihood estimation
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    limited failure population
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    smallest extreme value distribution
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    time-to-failure distribution
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    laboratory life tests
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