Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (Q5503764)
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scientific article; zbMATH DE number 5493371
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimum step‐stress accelerated life test plans for log‐location‐scale distributions |
scientific article; zbMATH DE number 5493371 |
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Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (English)
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16 January 2009
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cumulative exposure model
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large-sample approximate variance
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maximum likelihood
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