imaging of nanostructures (Q6684660)

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mathematical model for transmission electron microscopy of nanostructures
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imaging of nanostructures
mathematical model for transmission electron microscopy of nanostructures

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    We present a mathematical model and a tool chain for the numerical simulation of transmission electron microscopy (TEM) images of semiconductor quantum dots (QDs). This includes elasticity theory to obtain the strain profile coupled with the Darwin–Howie–Whelan equations, describing the propagation of the electron wave through the sample. This tool chain can be applied to generate a database of simulated transmission electron microscopy (TEM) images, which is a key element of a novel concept for model-based geometry reconstruction of semiconductor QDs, involving machine learning techniques.
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