A Trace-Based Interface Reduction Method for Highly Conducting Interfaces

DOI10.48550/arXiv.2606.28700MaRDI QIDQ7270501zbMATH OpenarXivFDO

Authors So-Hsiang Chou, Do Y. Kwak, Do Young Kwak

Publication date 27 June 2026

Published in arXiv

Tldr We present an efficient numerical approach for elliptic interface problems with highly conducting interfaces by formulating a trace-based Schur complement system involving the Dirichlet-to-Neumann jump operator and surface stiffness operator. This new formulation reduces the computational cost of solving elliptic interface problems on complex geometries, enabling efficient solution of large-scale industrial applications.

Full work available at URL https://doi.org/10.48550/arXiv.2606.28700

Mathematics Subject Classification ID

PDEs with low regular coefficients and/or low regular data (35R05) Numerical solution of discretized equations for boundary value problems involving PDEs (65N22) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Boundary element methods for boundary value problems involving PDEs (65N38)

arXiv classification

math.NA

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