A Trace-Based Interface Reduction Method for Highly Conducting Interfaces (Q7270501)
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A Trace-Based Interface Reduction Method for Highly Conducting Interfaces (English)
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27 June 2026
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math.NA
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So-Hsiang Chou
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Do Young Kwak
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We present an efficient numerical approach for elliptic interface problems with highly conducting interfaces by formulating a trace-based Schur complement system involving the Dirichlet-to-Neumann jump operator and surface stiffness operator. This new formulation reduces the computational cost of solving elliptic interface problems on complex geometries, enabling efficient solution of large-scale industrial applications.
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Trace-Based Interface
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Elliptic Interface Problems
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Surface Laplacian
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Dirichlet-to-Neumann Jump
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Schur Complement Formulation
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