A complete critical path algorithm for test generation of combinational circuits

DOI10.1007/BF02943410MaRDI QIDQ2640582zbMATH OpenFDO

Authors Quan Zhou, Daozheng Wei

Publication date 1991

Published in Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/BF02943410

Mathematics Subject Classification ID

Parallel algorithms in computer science (68W10) Information and communication theory, circuits (94-XX)

Cites work

• An Algorithm for the Generation of Test Sets for Combinational Logic Networks
• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
• Analyzing Errors with the Boolean Difference
• Diagnosis of Automata Failures: A Calculus and a Method
• scientific article; zbMATH DE number 3670361 (Why is no real title available?)
• Properties of Faults and Criticalities of Values under Tests for Combinational Networks

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