Diagnosis of Automata Failures: A Calculus and a Method

DOI10.1147/RD.104.0278MaRDI QIDQ5522666zbMATH OpenOpenAlexFDO

Authors P. J. Roth

Publication date 1966

Published in IBM Journal of Research and Development (Search for Journal in Brave)

Full work available at URL https://semanticscholar.org/paper/e490bf9644f42da53e7d26e0a1e16fcc98612dee

zbMATH Keywords

numerical analysis

Cited in

(16)

• An efficient algorithm for calculating Boolean difference
• Complete test-set generation for bridging faults in combinational-logic circuits
• Test derivation through critical path transitions
• Efficient VLSI fault simulation
• Constraint satisfaction using constraint logic programming
• Electronic circuit diagnostic expert systems - a survey
• Maxx: Test pattern optimisation with local search over an extended logic
• A complete critical path algorithm for test generation of combinational circuits
• Quick detection of faults in combinational networks designed in minterm format by computing a single novel parameter
• Fault masking probabilities with single and multiple signature analysis
• Propositional calculus problems in CHIP
• Development of tests for VLSI circuit testability at the upper design levels
• Forecasting the efficiency of test generation algorithms for combinational circuits
• Semi-tensor product-based algebra-logic mixed representation and fault diagnosis for a class of gate networks
• Solution of systems of Boolean equations via the integer domain
• Thread-parallel integrated test pattern generator utilizing satisfiability analysis

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