A defect localization scheme for cellular nanocomputers

DOI10.1007/S00354-008-0056-6MaRDI QIDQ1031922zbMATH OpenOpenAlexFDO

Authors Teijiro Isokawa, Ferdinand Peper, Shin'ya Kowada, Naotake Kamiura, Nobuyuki Matsui

Publication date 23 October 2009

Published in New Generation Computing (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s00354-008-0056-6

zbMATH Keywords

asynchronousbiased random walkcellular automatadefect tolerancenanotechnology

Mathematics Subject Classification ID

Cellular automata (computational aspects) (68Q80)

Recommendations

• Defect-tolerance in cellular nanocomputers
• Reconfiguring Circuits Around Defects in Self-Timed Cellular Automata
• Online Marking of Defective Cells by Random Flies
• FAULT-TOLERANT NANOCOMPUTERS BASED ON ASYNCHRONOUS CELLULAR AUTOMATA
• scientific article; zbMATH DE number 4070324

Cites work

• Automata and concurrency
• Defect-tolerance in cellular nanocomputers
• FAULT-TOLERANT NANOCOMPUTERS BASED ON ASYNCHRONOUS CELLULAR AUTOMATA
• scientific article; zbMATH DE number 3119645 (Why is no real title available?)
• Online Marking of Defective Cells by Random Flies
• Self-Timed Cellular Automata and their computational ability

Cited in

(6)

• Tropical algebra based framework for error propagation analysis in systolic arrays
• Online Marking of Defective Cells by Random Flies
• Reconfiguring Circuits Around Defects in Self-Timed Cellular Automata
• FAULT-TOLERANT NANOCOMPUTERS BASED ON ASYNCHRONOUS CELLULAR AUTOMATA
• Defect-tolerant logic mapping for nanocrossbars based on two-dimensional sort
• Defect-tolerance in cellular nanocomputers

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