A neural network algorithm for digital circuits test generation

MaRDI QIDQ2775955zbMATH OpenFDO

Authors Juraj Štefanovič

Publication date 15 December 2002

zbMATH Keywords

automatic test pattern generation

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Computing methodologies and applications (68U99) Nonnumerical algorithms (68W05)

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Cited in

(2)

• scientific article; zbMATH DE number 51959 (Why is no real title available?)
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