scientific article; zbMATH DE number 51959

MaRDI QIDQ4002329zbMATH OpenFDO

Authors Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

Publication date 18 September 1992

zbMATH Keywords

digital logic circuitsdigital testingHopfield energy functionneural modelsneural networks massive parallelismNP-complete problemsQuadratic 0-1 programmingtest generation problem

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Neural networks for/in biological studies, artificial life and related topics (92B20) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Detection theory in information and communication theory (94A13) Fault detection; testing in circuits and networks (94C12)

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• An application of Hopfield networks to worst-case power analysis of RT-level VLSI systems
• A neural network algorithm for digital circuits test generation
• Non-linear feedback neural networks. VLSI implementations and applications
• Using a neural network in the software testing process
• Hyperneural network-an efficient model for test generation in digital circuits
• APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS

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