Automatic test generation algorithms for analogue circuits

DOI10.1049/IP-CDS:19960898MaRDI QIDQ3126029zbMATH OpenOpenAlexFDO

Authors

Publication date 23 March 1997

Published in IEE Proceedings - Circuits, Devices and Systems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1049/ip-cds:19960898

zbMATH Keywords

analogue circuitsautomatic test generation

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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