Algorithm for testing circuit stability
The stability of an operating point in an electronic circuit containing \(R\), \(L\), \(C\) elements as well as active elements is of high interest. In this paper, the author succeeded in finding some criteria insuring the (in)stability of the network when the reactive elements are located on some positive prescribed intervals. The derived criteria are based on some interesting properties of determinants. An example is presented. We must remark that the references are quoted in a funny way: for example, although there are only 12 references given at the end of the paper, in the text the author quotes references [14] and [16].
- Algorithms for the Routh-Hurwitz stability test
- On the mechanism of recursive stability-test algorithms
- Verifying minimum stable circuit values
- An efficient algorithm for batch stability testing
- scientific article; zbMATH DE number 4028638
- Fast stability test algorithm for discrete time systems
- Automatic test generation algorithms for analogue circuits
- New stability test algorithm for two-dimensional digital filters
- Conditional testing for Cardot circuits
- Algebraic tests for limit stability
This page was built for publication: Algorithm for testing circuit stability
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q1847688)