DNA computing approach for automated test pattern generation for digital circuits

DOI10.1080/00207720701748281MaRDI QIDQ5402738zbMATH OpenOpenAlexFDO

Authors Amardeep Singh, Maninder Kaur

Publication date 17 March 2014

Published in International Journal of Systems Science. Principles and Applications of Systems and Integration (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00207720701748281

zbMATH Keywords

DNA computinggenetic algorithmmolecular computingsimulation annealingATPG

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• Automated Design and Verification of Localized DNA Computation Circuits
• Test generation of the digital circuits based on the genetic algorithms
• Automated design and programming of a microfluidic DNA computer
• Automatic test generation algorithms for analogue circuits

Cites work

• APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS
• On applying molecular computation to binary linear codes
• Optimization by simulated annealing
• Polynomially Complete Fault Detection Problems

Cited in

(2)

• DNA and quantum based algorithms for VLSI circuits testing
• Automated Design and Verification of Localized DNA Computation Circuits

This page was built for publication: DNA computing approach for automated test pattern generation for digital circuits

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5402738)