Polynomially Complete Fault Detection Problems

DOI10.1109/T-C.1975.224205MaRDI QIDQ4057596zbMATH OpenFDO

Authors Oscar H. Ibarra, Sartaj Sahni

Publication date 1975

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/T-C.1975.224205

Mathematics Subject Classification ID

Analysis of algorithms and problem complexity (68Q25)

Cited in

(11)

• The max-cut problem and quadratic 0-1 optimization; polyhedral aspects, relaxations and bounds
• Confidence intervals for expected coverage from a beta testability model
• Electronic circuit diagnostic expert systems - a survey
• A series of impulse functions as a model for random detectability profiles
• Maxx: Test pattern optimisation with local search over an extended logic
• DNA and quantum based algorithms for VLSI circuits testing
• Exhaustive testing of almost all devices with outputs depending on limited number of inputs
• Generating test patterns for FPGA circuits: a quantum computing approach
• DNA computing approach for automated test pattern generation for digital circuits
• Development of tests for VLSI circuit testability at the upper design levels
• New bounds for the -k-cut and chromatic number of a graph

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