A series of impulse functions as a model for random detectability profiles

DOI10.1016/0893-9659(93)90029-MMaRDI QIDQ2367976zbMATH OpenOpenAlexFDO

Authors Hassan Farhat

Publication date 26 August 1993

Published in Applied Mathematics Letters (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0893-9659(93)90029-m

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites work

• A Deductive Method for Simulating Faults in Logic Circuits
• Confidence intervals for expected coverage from a beta testability model
• Polynomially Complete Fault Detection Problems

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