Applications of finite element methods for reliability studies on ULSI interconnections.

DOI10.1007/978-0-85729-310-7MaRDI QIDQ626084zbMATH OpenOpenAlexFDO

Authors Juan-Miguel Gracia

Publication date 21 February 2011

Published in Springer Series in Reliability Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-0-85729-310-7

zbMATH Keywords

finite element methodreliability engineeringUSLI interconnection

Mathematics Subject Classification ID

General applied mathematics (00A69) General theory of mathematical modeling (00A71) Applications to the sciences (65Z99) Control of mechanical systems (70Q05) Finite element methods applied to problems in solid mechanics (74S05) Finite element methods applied to problems in fluid mechanics (76M10) Application models in control theory (93C95)

Review text

This monograph provides a detailed description of the application of finite element methods (FEM) to the study of ULSI interconnect reliability. Over the past decades, the application of FEM has become widespread and continues to lead to a much better understanding of reliability physics. The monograph {\parindent=4mm \begin{itemize}\item[--] introduces the principles of FEM, \item[--] reviews numerical modeling of ULSI interconnect reliability, \item[--] describes the physical mechanism of ULSI interconnect reliability encountered in the electronic industry, and \item[--] discusses in detail the use of FEM to understand and improve ULSI interconnect reliability from both the physical and the practical perspective, incorporating the Monte Carlo method. \end{itemize}} A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader's understanding of the methodology and its verification. Actual experimental results and micrographs on USLI interconnects are also included. The monograph is a good reference book for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEM for reliability applications.

Recommendations

• Applications of FEM for multiple laminated structure in electronic packaging
• Reliability methods for finite element models.
• Multiscale modeling of degradation and failure of interconnect lines driven by electromigration and stress gradients
• Finite element applications. A practical guide to the FEM process
• A Practical Guide to Reliable Finite Element Modelling

Cited in

(1)

• Applications of FEM for multiple laminated structure in electronic packaging

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