Cost-Optimized Burn-In Duration for Repairable Electronic Systems

DOI10.1109/TR.1977.5220114MaRDI QIDQ4145111zbMATH OpenFDO

Authors Kenneth T. Plesser, Thomas O. Field

Publication date 1977

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TR.1977.5220114

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Cited in

(2)

• Determination of the optimal accelerated burn-in time under Arrhenius-log normal distribution assumption
• Optimal burn-in time to minimize the cost for general repairable products sold under warranty

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