Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

DOI10.1107/S2053273319012804MaRDI QIDQ6547594zbMATH OpenFDO

Authors Yintao Song, Nobumichi Tamura, Chenbo Zhang, M. Karami, Xian Chen

Publication date 30 May 2024

Published in Acta Crystallographica. Section A (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1107/S2053273319012804

zbMATH Keywords

data-driven analysisPCA labelerproperty mapssynchrotron X-ray microdiffractionunsupervised learning

Mathematics Subject Classification ID

Diffraction, scattering (78A45)

Cites work

• scientific article; zbMATH DE number 6378127 (Why is no real title available?)
• Learning representations by back-propagating errors
• Least squares quantization in PCM
• Silhouettes: a graphical aid to the interpretation and validation of cluster analysis
• The analytical expression of the results of the theory of space groups.

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