Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis (Q6547594)
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scientific article; zbMATH DE number 7857539
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| English | Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis |
scientific article; zbMATH DE number 7857539 |
Statements
Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis (English)
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30 May 2024
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synchrotron X-ray microdiffraction
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data-driven analysis
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PCA labeler
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unsupervised learning
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property maps
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