Deterministic polynomial identity tests for multilinear bounded-read formulae
From MaRDI portal
Recommendations
- scientific article; zbMATH DE number 2079409
- Improved Polynomial Identity Testing for Read-Once Formulas
- Identity testing, multilinearity testing, and monomials in read-once/twice formulas and branching programs
- Deterministically testing sparse polynomial identities of unbounded degree
- Read-once polynomial identity testing
- Read-once polynomial identity testing
- Deterministic polynomial identity testing in non-commutative models
- scientific article; zbMATH DE number 7758310
- Derandomizing polynomial identity tests means proving circuit lower bounds
- Derandomizing polynomial identity tests means proving circuit lower bounds
Cites work
- scientific article; zbMATH DE number 5899249 (Why is no real title available?)
- scientific article; zbMATH DE number 3698383 (Why is no real title available?)
- scientific article; zbMATH DE number 2151804 (Why is no real title available?)
- A probabilistic remark on algebraic program testing
- An almost optimal rank bound for depth-3 identities
- Arithmetic circuits: a chasm at depth 3
- Arithmetic circuits: a survey of recent results and open questions
- Black box polynomial identity testing of generalized depth-3 arithmetic circuits with bounded top fan-in
- Black-box identity testing of depth-4 multilinear circuits
- Blackbox Polynomial Identity Testing for Depth 3 Circuits
- Blackbox identity testing for bounded top-fanin depth-3 circuits: the field doesn't matter
- Depth-3 arithmetic circuits over fields of characteristic zero
- Derandomizing polynomial identity tests means proving circuit lower bounds
- Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in
- Deterministically testing sparse polynomial identities of unbounded degree
- Diagonal Circuit Identity Testing and Lower Bounds
- Fast Probabilistic Algorithms for Verification of Polynomial Identities
- Hardness-randomness tradeoffs for bounded depth arithmetic circuits
- Improved Polynomial Identity Testing for Read-Once Formulas
- Jacobian hits circuits: hitting-sets, lower bounds for depth-\(D\) occur-\(k\) formulas \& depth-\(3\) transcendence degree-\(k\) circuits
- Locally Decodable Codes with Two Queries and Polynomial Identity Testing for Depth 3 Circuits
- Lower bounds and separations for constant depth multilinear circuits
- Lower bounds on arithmetic circuits via partial derivatives
- On circuit lower bounds from derandomization
- Primality and identity testing via Chinese remaindering
- Progress on polynomial identity testing
- Pseudorandom generators, typically-correct derandomization, and circuit lower bounds
- Randomness efficient identity testing of multivariate polynomials
- Read-once polynomial identity testing
- The complexity of partial derivatives
- The ideal membership problem and polynomial identity testing
Cited in
(16)- Characterizing arithmetic read-once formulae
- Recent results on polynomial identity testing
- Identity testing, multilinearity testing, and monomials in read-once/twice formulas and branching programs
- Algebraic independence and blackbox identity testing
- A polynomial-time dependence test for determining integer-valued solutions in multi-dimensional arrays under variable bounds
- Deterministic identity testing of depth-\(4\) multilinear circuits with bounded top fan-in
- A note on parameterized polynomial identity testing using hitting set generators
- Deterministically testing sparse polynomial identities of unbounded degree
- scientific article; zbMATH DE number 2079409 (Why is no real title available?)
- Linear-Time Version of Holub’s Algorithm for Morphic Imprimitivity Testing
- Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in
- Sums of read-once formulas: how many summands are necessary?
- Linear independence, alternants, and applications
- Monomials, multilinearity and identity testing in simple read-restricted circuits
- Sums of read-once formulas: how many summands suffice?
- Black-box identity testing of depth-4 multilinear circuits
This page was built for publication: Deterministic polynomial identity tests for multilinear bounded-read formulae
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q901932)
