Hybrid variable finite elements for semiconductor devices

DOI10.1016/0898-1221(90)90138-AMaRDI QIDQ918175zbMATH OpenOpenAlexFDO

Authors Zhangxin Chen

Publication date 1990

Published in Computers & Mathematics with Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0898-1221(90)90138-a

zbMATH Keywords

error estimateGalerkin methodhybrid variable finite elementssemiconductor devices

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Error bounds for boundary value problems involving PDEs (65N15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Applications to the sciences (65Z05) Technical applications of optics and electromagnetic theory (78A55)

Review text

The paper is devoted to the numerical solution of partial differential equations in two dimensions. The technique of hybrid variable finite elements for semiconductor devices is employed. Main result: The author shows that the system arising from the method proposed by \textit{F. Brezzi}, \textit{L. D. Marini} and \textit{P. Pietra} for the solution of semiconductor device equations [SIAM J. Numer. Anal. 26, No.6, 1342-1355 (1989; Zbl 0686.65088)] has essentially diagonal matrices, and that, by use of a certain numerical integration, the methods are identical with the classical Galerkin method. Moreover the paper indicates how the methods generalize to a more general case (in which the function \(\psi\) might depend on u). Very important aspect of this work is the error estimate for the approximation of current, \((=\sigma =\nabla u+u\nabla \psi)\).

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Cites work

• Generalized Finite Element Methods: Their Performance and Their Relation to Mixed Methods
• scientific article; zbMATH DE number 3679037 (Why is no real title available?)
• scientific article; zbMATH DE number 3529634 (Why is no real title available?)
• Two-Dimensional Exponential Fitting and Applications to Drift-Diffusion Models

Cited in

(2)

• Nonlinear boundary value problems with application to semiconductor device equations
• Projection finite element methods for semiconductor device equations

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