Hybrid variable finite elements for semiconductor devices

DOI10.1016/0898-1221(90)90138-AMaRDI QIDQ918175zbMATH OpenOpenAlexFDO

Authors Zhangxin Chen

Publication date 1990

Published in Computers & Mathematics with Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0898-1221(90)90138-a

zbMATH Keywords

error estimateGalerkin methodsemiconductor deviceshybrid variable finite elements

Mathematics Subject Classification ID

Technical applications of optics and electromagnetic theory (78A55) PDEs in connection with optics and electromagnetic theory (35Q60) Error bounds for boundary value problems involving PDEs (65N15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Applications to the sciences (65Z05)

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• MIXED FINITE ELEMENT APPROACH AND NONLINEAR IMPLICIT SCHEMES FOR DRIFT‐DIFFUSION EQUATION SOLUTION OF 2D HETEROJUNCTION SEMICONDUCTOR DEVICES

Cites work

• scientific article; zbMATH DE number 3679037 (Why is no real title available?)
• scientific article; zbMATH DE number 3529634 (Why is no real title available?)
• Generalized Finite Element Methods: Their Performance and Their Relation to Mixed Methods
• Two-Dimensional Exponential Fitting and Applications to Drift-Diffusion Models

Cited in

(2)

• Nonlinear boundary value problems with application to semiconductor device equations
• Projection finite element methods for semiconductor device equations

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