Identification of semiconductor contact resistivity
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Recommendations
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Cited in
(12)- Analysis of contact resistivity for multilevel transistors
- Identification of contact regions in semiconductor transistors by level-set methods
- On a logarithmic stability estimate for an inverse heat conduction problem
- Contact resistance of a square contact
- Analysis of an adaptive finite element method for recovering the Robin coefficient
- Recovery of an interface from boundary measurement in an elliptic differential equation
- Solving a nonlinear inverse Robin problem through a linear Cauchy problem
- Contact resistance of rectangular contact
- Numerical methods for piecewise constant Robin coefficient
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- Optimization approach based on genetic algorithm for a Robin coefficient problem
- Stability estimate for an inverse problem of a hyperbolic heat equation from boundary measurement
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