On inverse problems for semiconductor equations

DOI10.1007/S00032-004-0025-6MaRDI QIDQ879738zbMATH OpenOpenAlexFDO

Authors Martin Burger, Heinz W. Engl, A. Leitão, Peter Alexander Markowich

Publication date 9 May 2007

Published in Milan Journal of Mathematics (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/2011.11370

zbMATH Keywords

inverse problemssemiconductor devicesstationary drift-diffusion equations

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Ionized gas flow in electromagnetic fields; plasmic flow (76X05) Statistical mechanics of semiconductors (82D37)

Abstract: This paper is devoted to the investigation of inverse problems related to stationary drift-diffusion equations modeling semiconductor devices. In this context we analyze several identification problems corresponding to different types of measurements, where the parameter to be reconstructed is an inhomogeneity in the PDE model (doping profile). For a particular type of measurement (related to the voltage-current map) we consider special cases of drift-diffusion equations, where the inverse problems reduces to a classical inverse conductivity problem. A numerical experiment is presented for one of these special situations (linearized unipolar case).

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• On projective Landweber-Kaczmarz methods for solving systems of nonlinear ill-posed equations
• An inverse problem of charge-collection microscopy
• Identification of semiconductor contact resistivity
• On a family of gradient-type projection methods for nonlinear ill-posed problems
• Inverse problems for semiconductors: models and methods
• On inverse doping profile problems for the stationary voltage–current map
• The method of integral equations in the oblique derivative problem arising in semiconductor physics
• Reconstruction of the doping profile in Vlasov-Poisson system
• Bayesian inversion for the identification of the doping profile in unipolar semiconductor devices
• Adjoint-Based Bayesian Uncertainty Quantification for PDE-Constrained Inverse Problems with Application to Semiconductor Imaging
• On steepest-descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations

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