On inverse problems for semiconductor equations

DOI10.1007/S00032-004-0025-6MaRDI QIDQ879738zbMATH OpenOpenAlexFDO

Authors Martin Burger, Heinz W. Engl, A. Leitão, Peter Alexander Markowich

Publication date 9 May 2007

Published in Milan Journal of Mathematics (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/2011.11370

zbMATH Keywords

inverse problemssemiconductor devicesstationary drift-diffusion equations

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Ionized gas flow in electromagnetic fields; plasmic flow (76X05) Statistical mechanics of semiconductors (82D37)

Abstract: This paper is devoted to the investigation of inverse problems related to stationary drift-diffusion equations modeling semiconductor devices. In this context we analyze several identification problems corresponding to different types of measurements, where the parameter to be reconstructed is an inhomogeneity in the PDE model (doping profile). For a particular type of measurement (related to the voltage-current map) we consider special cases of drift-diffusion equations, where the inverse problems reduces to a classical inverse conductivity problem. A numerical experiment is presented for one of these special situations (linearized unipolar case).

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Cited in

(13)

• On a family of gradient-type projection methods for nonlinear ill-posed problems
• Modeling and simulation of the lateral photovoltage scanning method
• The method of integral equations in the oblique derivative problem arising in semiconductor physics
• Identification of doping profiles in semiconductor devices
• On steepest-descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations
• A complete analysis of a classical Poisson-Nernst-Planck model for ionic flow
• One-dimensional steady-state Poisson-Nernst-Planck systems for ion channels with multiple ion species
• On inverse doping profile problems for the stationary voltage–current map
• Reconstruction of the doping profile in Vlasov-Poisson system
• Inverse problems for semiconductors: models and methods
• On projective Landweber-Kaczmarz methods for solving systems of nonlinear ill-posed equations
• Identification of semiconductor contact resistivity
• An inverse problem of charge-collection microscopy

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