On inverse doping profile problems for the stationary voltage–current map
DOI10.1088/0266-5611/22/3/021zbMATH Open1099.35173arXiv2011.12200OpenAlexW2008710105MaRDI QIDQ5478604FDOQ5478604
Authors: A. Leitão, J. P. Zubelli, Peter Alexander Markowich
Publication date: 13 July 2006
Full work available at URL: https://arxiv.org/abs/2011.12200
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Cited In (16)
- On a family of gradient-type projection methods for nonlinear ill-posed problems
- On the inverse doping profile problem
- Recovering doping profiles in semiconductor devices with the Boltzmann-Poisson model
- Modeling and simulation of the lateral photovoltage scanning method
- Identification of doping profiles in semiconductor devices
- A regularization method based on level sets and augmented Lagrangian for parameter identification problems with piecewise constant solutions
- On inverse problems for semiconductor equations
- Semiconductors and Dirichlet-to-Neumann maps
- On steepest-descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations
- Geometric programming approach to doping profile design optimization of metal-oxide-semiconductor devices
- Suppressing instability in a Vlasov-Poisson system by an external electric field through constrained optimization
- Reconstruction of the doping profile in Vlasov-Poisson system
- Inverse doping problems for a P-N junction
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- Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced Current Image
- An inverse problem of charge-collection microscopy
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