Inverse doping problems for a P-N junction
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Publication:3410885
DOI10.1163/156939406778474541zbMATH Open1111.35100OpenAlexW4247855638MaRDI QIDQ3410885FDOQ3410885
Authors: Isabella Torcicollo, Giuseppe Alì, Sergio Vessella 
Publication date: 16 November 2006
Full work available at URL: https://doi.org/10.1163/156939406778474541
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Initial-boundary value problems for second-order parabolic equations (35K20) Inverse problems for PDEs (35R30) Statistical mechanics of semiconductors (82D37)
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- Semiconductors and Dirichlet-to-Neumann maps
- On inverse doping profile problems for the stationary voltage–current map
- On identification of doping profile in semiconductors
- Reconstruction of the doping profile in Vlasov-Poisson system
- Inverse doping problems for semiconductor devices
- Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced Current Image
- An inverse problem of charge-collection microscopy
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