An inverse problem of charge-collection microscopy

DOI10.1088/0266-5611/2/3/001zbMATH Open0603.45011OpenAlexW1999967052MaRDI QIDQ3739655FDOQ3739655

Cesare Donolato

Publication date: 1986

Published in: Inverse Problems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1088/0266-5611/2/3/001

zbMATH Keywords

semiconductor devicedepth distributioncharge-collection microscopycharge-collection probabilityelectron generation function

Mathematics Subject Classification ID

Numerical methods for integral equations (65R20) Volterra integral equations (45D05) Motion of charged particles (78A35) Integral equations of the convolution type (Abel, Picard, Toeplitz and Wiener-Hopf type) (45E10) Integral equations with miscellaneous special kernels (45H05)

Cited In (3)

• Inverse problem of recovering the electron diffusion coefficient
• Title not available (Why is that?)
• Optimization problems in electron microscopy of single particles

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