An inverse problem of charge-collection microscopy

DOI10.1088/0266-5611/2/3/001MaRDI QIDQ3739655zbMATH OpenOpenAlexFDO

Authors Cesare Donolato

Publication date 1986

Published in Inverse Problems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1088/0266-5611/2/3/001

zbMATH Keywords

semiconductor devicedepth distributioncharge-collection microscopycharge-collection probabilityelectron generation function

Mathematics Subject Classification ID

Numerical methods for integral equations (65R20) Volterra integral equations (45D05) Motion of charged particles (78A35) Integral equations of the convolution type (Abel, Picard, Toeplitz and Wiener-Hopf type) (45E10) Integral equations with miscellaneous special kernels (45H05)

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Cited in

(3)

• Inverse problem of recovering the electron diffusion coefficient
• scientific article; zbMATH DE number 2042481 (Why is no real title available?)
• Optimization problems in electron microscopy of single particles

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