Integral equation modeling of electrostatic interactions in atomic force microscopy

DOI10.1007/978-0-8176-4671-4_27MaRDI QIDQ3399869zbMATH OpenOpenAlexFDO

Authors

Publication date 15 January 2010

Published in Integral Methods in Science and Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-0-8176-4671-4_27

zbMATH Keywords

arbitrary charge distributionCoulombic interactionnoncontact mode

Mathematics Subject Classification ID

Fredholm integral equations (45B05) Electro- and magnetostatics (78A30) Boundary element methods applied to problems in optics and electromagnetic theory (78M15)

Recommendations

• Variational treatment of electrostatic interaction force in atomic force microscopy
• Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
• Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
• Modeling of electromechanical contact on a microscopic lengthscale
• Modal interactions in contact-mode atomic force microscopes

Cited in

(7)

• The contribution of the electrostatic proximity force to atomic force microscopy with insulators
• Modeling of electromechanical contact on a microscopic lengthscale
• scientific article; zbMATH DE number 1997557 (Why is no real title available?)
• Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
• Biophysical applications of scanning ion conductance microscopy (SICM)
• A two-dimensional Lorentzian distribution for an atomic force microscopy simulator
• Variational treatment of electrostatic interaction force in atomic force microscopy

This page was built for publication: Integral equation modeling of electrostatic interactions in atomic force microscopy

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3399869)