A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (Q1027930)

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A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts
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    A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (English)
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    30 June 2009
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    drop impacts
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    shocks
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    polysilicon MEMS sensors
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    multi-scale FE analysis
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    micro-mechanics
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