Confidence intervals for expected coverage from a beta testability model (Q1205922)
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scientific article; zbMATH DE number 148294
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| English | Confidence intervals for expected coverage from a beta testability model |
scientific article; zbMATH DE number 148294 |
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Confidence intervals for expected coverage from a beta testability model (English)
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1 April 1993
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testability distribution
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VLSI circuit
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fault coverage
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beta distribution
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random detection counts
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beta-binomial distribution
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confidence intervals
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proper sample size
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0.7865203022956848
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0.7148875594139099
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0.6799893379211426
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0.679564356803894
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