Confidence intervals for expected coverage from a beta testability model

DOI10.1016/0898-1221(92)90158-EMaRDI QIDQ1205922zbMATH OpenFDO

Authors Steven G. From, Hassan Farhat

Publication date 1 April 1993

Published in Computers & Mathematics with Applications (Search for Journal in Brave)

zbMATH Keywords

beta distributionconfidence intervalsbeta-binomial distributionfault coverageVLSI circuitproper sample sizerandom detection countstestability distribution

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, testing and fault tolerance of networks and computer systems (68M15) Computer system organization (68M99)

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Cites work

• 394: The Analysis of Binary Responses from Toxicological Experiments Involving Reproduction and Teratogenicity
• A Deductive Method for Simulating Faults in Logic Circuits
• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
• Approximation Theorems of Mathematical Statistics
• Confidence intervals for expected coverage from a beta testability model
• Polynomially Complete Fault Detection Problems

Cited in

(4)

• Fault coverage and test length estimation for random pattern testing
• A series of impulse functions as a model for random detectability profiles
• Coverage estimation using statistics of the extremes for when testing reveals no failures
• Confidence intervals for expected coverage from a beta testability model

Describes a project that uses

Uses Software

• SOCRATES
• IMSL Numerical Libraries

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