Iterative boundary element method for crack analysis of two-dimensional piezoelectric semiconductor (Q1655978)
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scientific article; zbMATH DE number 6915845
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| English | Iterative boundary element method for crack analysis of two-dimensional piezoelectric semiconductor |
scientific article; zbMATH DE number 6915845 |
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Iterative boundary element method for crack analysis of two-dimensional piezoelectric semiconductor (English)
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10 August 2018
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piezoelectric semiconductors
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iterative boundary element method
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elliptical hole
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crack
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intensity factors
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0.8442535996437073
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0.8329856991767883
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0.8289721012115479
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0.8289442658424377
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