Analytical description of fracture features in single crystal silicon (Q2035173)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Analytical description of fracture features in single crystal silicon |
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Analytical description of fracture features in single crystal silicon (English)
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24 June 2021
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single crystal silicon
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fractography
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crack branching
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fracture surface
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secondary Wallner line
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mirror-hackle boundary
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