Analytical description of fracture features in single crystal silicon (Q2035173)
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scientific article; zbMATH DE number 7362877
| Language | Label | Description | Also known as |
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| default for all languages | No label defined |
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| English | Analytical description of fracture features in single crystal silicon |
scientific article; zbMATH DE number 7362877 |
Statements
Analytical description of fracture features in single crystal silicon (English)
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24 June 2021
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single crystal silicon
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fractography
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crack branching
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fracture surface
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secondary Wallner line
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mirror-hackle boundary
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0.701202929019928
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0.6764214038848877
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0.66974276304245
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0.6685987114906311
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0.6624002456665039
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