The modulus of the Fourier transform on a sphere determines 3-dimensional convex polytopes (Q2162405)

In this paper, the authors prove that in small-angle X-ray scattering and partly also in wide-angle X-ray scattering of nanoparticles, the modulus of the Fourier transform of the reflected beam wave vectors can be ``approximately'' measured on the Ewald sphere. This is related to uniqueness questions in the sense that by the obtained result, at least theoretically, the polytopes can be reconstructed from the measurements. The statement can be formulated in a more general form, and therefore several definitions and notations are needed first. An application to the field of crystallography regarding the question of whether a nanoparticle modelled as a convex polytope is uniquely determined by the intensities of its X-ray diffraction pattern on the Ewald sphere.