Sequential fault modeling and test pattern generation for CMOS iterative logic arrays (Q3417048)
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scientific article; zbMATH DE number 5105687
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| English | Sequential fault modeling and test pattern generation for CMOS iterative logic arrays |
scientific article; zbMATH DE number 5105687 |
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Sequential fault modeling and test pattern generation for CMOS iterative logic arrays (English)
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9 January 2007
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iterative logic arrays
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0.8612431287765503
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0.8141298890113831
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0.814103364944458
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0.799210250377655
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0.7525430917739868
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