Testing CMOS combinational iterative logic arrays for realistic faults (Q4332045)
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scientific article; zbMATH DE number 983903
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| English | Testing CMOS combinational iterative logic arrays for realistic faults |
scientific article; zbMATH DE number 983903 |
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Testing CMOS combinational iterative logic arrays for realistic faults (English)
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27 February 1997
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VLSI testing
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Test pattern generation
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Iterative logic arrays
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Cell fault model
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Sequential faults
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C-testability
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Linear-testability
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0.9032011032104492
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0.8935086727142334
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0.8734992742538452
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0.8612431287765503
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0.8496610522270203
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