Complete test generation method for all stuck-at faults in combinational circuits (Q3479983)
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scientific article; zbMATH DE number 4150090
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| default for all languages | No label defined |
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| English | Complete test generation method for all stuck-at faults in combinational circuits |
scientific article; zbMATH DE number 4150090 |
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Complete test generation method for all stuck-at faults in combinational circuits (English)
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1990
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combinational logic circuits
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complete fault detection test sets
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stuck- at faults
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logic gates
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0.8675457239151001
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0.8418570756912231
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