Can large fanin circuits perform reliable computations in the presence of noise? (Q4364577)
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scientific article; zbMATH DE number 1088262
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| English | Can large fanin circuits perform reliable computations in the presence of noise? |
scientific article; zbMATH DE number 1088262 |
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17 November 1997
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fault models
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unbounded fanin circuits
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reliable threshold circuit
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0.9291353821754456
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0.8186765313148499
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0.8149234652519226
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0.8050709962844849
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0.8013197779655457
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Can large fanin circuits perform reliable computations in the presence of noise? (English)
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The investigated fault models for unbounded fanin circuits and weakly-reliably or strongly-reliably computations of a function \(f\), are defined in section 2. For weakly reliable \textit{and/or} circuits a lower bound is presented for the number of input variables) on which a function may depend. In section 4 it is shown that a reliable threshold circuit can essentially be built only from gates on moderately large fanin. Finally, it is shown how threshold circuits can be made weakly reliable with only a polynomial increase of size. For the entire collection see [Zbl 0869.00027].
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