Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections (Q4520151)
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scientific article; zbMATH DE number 1542291
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| English | Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections |
scientific article; zbMATH DE number 1542291 |
Statements
Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections (English)
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12 December 2000
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coupling noise
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signal activity
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delay uncertainty
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deep submicrometer
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CMOS integrated circuits
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interconnect
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VLSI
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0.7246619462966919
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0.6899072527885437
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0.6899072527885437
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