Low-Transition Test Pattern Generation for BIST-Based Applications (Q4589549)
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scientific article; zbMATH DE number 6805686
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Low-Transition Test Pattern Generation for BIST-Based Applications |
scientific article; zbMATH DE number 6805686 |
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Low-Transition Test Pattern Generation for BIST-Based Applications (English)
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10 November 2017
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0.8696174
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0.8479841
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0.83892494
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0.8376377
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