Low-Transition Test Pattern Generation for BIST-Based Applications

DOI10.1109/TC.2007.70794zbMATH Open1373.68031MaRDI QIDQ4589549FDOQ4589549

Authors: Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed 

Publication date: 10 November 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

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Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Mathematical problems of computer architecture (68M07)

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