Low-Transition Test Pattern Generation for BIST-Based Applications

DOI10.1109/TC.2007.70794MaRDI QIDQ4589549zbMATHFDO

Authors Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed

Publication date 10 November 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Mathematical problems of computer architecture (68M07)

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