Reliability demonstration through accelerated degradation zero-failure testing under binomial distributions (Q4927687)
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scientific article; zbMATH DE number 6177885
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| default for all languages | No label defined |
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| English | Reliability demonstration through accelerated degradation zero-failure testing under binomial distributions |
scientific article; zbMATH DE number 6177885 |
Statements
20 June 2013
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optimum test plans
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degradation failure
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0.7356483936309814
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0.728723406791687
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