Reliability demonstration through accelerated degradation zero-failure testing under binomial distributions

DOI10.3969/J.ISSN.1001-506X.2012.09.35MaRDI QIDQ4927687zbMATH OpenFDO

Authors Xiuping Huang, Jinglun Zhou, Quan Sun, Jing Feng

Publication date 20 June 2013

Full work available at URL https://doi.org/10.3969/J.ISSN.1001-506X.2012.09.35

zbMATH Keywords

degradation failureoptimum test plans

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Recommendations

• scientific article; zbMATH DE number 6736757
• scientific article; zbMATH DE number 1121370
• Non-parametric predictive reliability demonstration for failure-free periods
• Experimental Design for a Class of Accelerated Degradation Tests
• scientific article; zbMATH DE number 1087008

Cited in

(4)

• Simultaneous demonstration tests involving sparse failures
• A Bayesian zero-failure reliability demonstration testing procedure for lognormal distribution
• scientific article; zbMATH DE number 1087008 (Why is no real title available?)
• Non-parametric predictive reliability demonstration for failure-free periods

This page was built for publication: Reliability demonstration through accelerated degradation zero-failure testing under binomial distributions

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4927687)