Gate-delay-fault testability properties of multiplexor-based networks (Q685105)
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scientific article; zbMATH DE number 417064
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Gate-delay-fault testability properties of multiplexor-based networks |
scientific article; zbMATH DE number 417064 |
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Gate-delay-fault testability properties of multiplexor-based networks (English)
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30 September 1993
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synthesis for test
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stuck-at faults
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gate-delay faults
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logic circuits
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Binary Decision Diagram
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0.8195439577102661
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0.789779782295227
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0.769229531288147
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0.7606127858161926
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0.7509447336196899
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