Synthesis of delay fault testability circuits (Q4420874)
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scientific article; zbMATH DE number 1966806
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Synthesis of delay fault testability circuits |
scientific article; zbMATH DE number 1966806 |
Statements
Synthesis of delay fault testability circuits (English)
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1996
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logic optimization
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testability enhancing transformations
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0.8195439577102661
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0.7869960069656372
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0.7677260041236877
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0.7670174241065979
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0.7594950795173645
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