Testability of positive integers (Q6983284)

The present research is devoted to representations of arbitrary positive integers. An introduction contains a brief note on the integer partition theory and some topics of the integer splitting estimation, as well as on advantages of the multi-valued logic system and some its applications. The main attention is given to the following: -- to prove that the testability \(\tau (n)\) of the set \(N_n=\{1,2, \dots , n\}\) is equal to \(\lceil \log_3(2n+1)\rceil\); -- to present ``an algorithm to output the representation of an arbitrary positive integer by the form \[ \sum_{i\in X} 3^i- \sum_{j\in Y} 3^j, \] where \(X\) and \(Y\) are two disjoint sets of some non-negative integers not exceeding \(\tau (n)\)''. The notions of testable and untestable numbers, the testability are explained, some auxiliary examples are noted.