Testability of positive integers

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The present research is devoted to representations of arbitrary positive integers.\N\NAn introduction contains a brief note on the integer partition theory and some topics of the integer splitting estimation, as well as on advantages of the multi-valued logic system and some its applications.\N\NThe main attention is given to the following:\N\N-- to prove that the testability \(\tau (n)\) of the set \(N_n=\{1,2, \dots , n\}\) is equal to \(\lceil \log_3(2n+1)\rceil\);\N\N-- to present ``an algorithm to output the representation of an arbitrary positive integer by the form\N\[\N\sum_{i\in X} 3^i- \sum_{j\in Y} 3^j,\N\]\Nwhere \(X\) and \(Y\) are two disjoint sets of some non-negative integers not exceeding \(\tau (n)\).\N\NThe notions of testable and untestable numbers, the testability are explained, some auxiliary examples are noted.











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