Equilibrium configurations of epitaxially strained thin films (Q991051)
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scientific article; zbMATH DE number 5777597
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| English | Equilibrium configurations of epitaxially strained thin films |
scientific article; zbMATH DE number 5777597 |
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Equilibrium configurations of epitaxially strained thin films (English)
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2 September 2010
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Summary: We present some regularity results on equilibrium configurations for a variational model introduced to describe the epitaxial growth of an elastic film over a thick flat substrate when a lattice mismatch between the two materials is present. We also give a sufficient condition for local minimality based on second variation and apply it to determine analitycally the critical threshold for the local minimality of the flat configuration.
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free boundary problems
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regularity
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local minimality
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second variation
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0.93988824
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0.92559403
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