On the Fault Testing for Reversible Circuits

DOI10.1007/978-3-540-77120-3_70MaRDI QIDQ5387815zbMATH OpenOpenAlexFDO

Authors Satoshi Tayu, Shigeru Ito, Shuichi Ueno

Publication date 27 May 2008

Published in Algorithms and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-3-540-77120-3_70

Mathematics Subject Classification ID

Computational difficulty of problems (lower bounds, completeness, difficulty of approximation, etc.) (68Q17) Fault detection; testing in circuits and networks (94C12)

Recommendations

• Universal test sets for reversible circuits (extended abstract)
• Test pattern generation effort evaluation of reversible circuits
• Fault diagnosis in reversible circuits under missing-gate fault model
• The Complexity of Fault Detection Problems for Combinational Logic Circuits
• Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report

Cites work

• scientific article; zbMATH DE number 1579275 (Why is no real title available?)
• Logical Reversibility of Computation

Cited in

(10)

• Test pattern generation effort evaluation of reversible circuits
• Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report
• Fault diagnosis in reversible circuits under missing-gate fault model
• Efficient techniques for fault detection and location of multiple controlled Toffoli-based reversible circuit
• Probabilistic model of fault detection in quantum circuits
• On the Complexity of Estimating the Size of a Test Set
• Design of an online testable ternary circuit from the truth table
• Universal test sets for reversible circuits (extended abstract)
• A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders
• The Complexity of Fault Detection Problems for Combinational Logic Circuits

This page was built for publication: On the Fault Testing for Reversible Circuits

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5387815)